The development of software for various branches of X-ray analytical instrumentation has been a keynote specialization of the Atomicus team since 1998. We have worked with several global players in this market to develop modern software products for X-ray data measurement, processing and analysis for thousands of instruments installed world-wide in different branches of industry and science. Among others, key directions of development are X-ray diffraction and spectroscopy, which are used in a broad range of applications in a wide spectrum of businesses: automotive, chemical, pharmaceutical, oil, mineralogy and geology, semiconductor, metals, life sciences, cement, polymers, and others.
Atomicus has over 15 years of experience of the development of products and solutions for instrumentation involving X-ray scattering techniques. In particular, the following applications have been key subjects of work for almost two decades:
- High-resolution X-ray diffraction, including geometrical considerations
- Diffraction from imperfect structures such as dislocations, defects, miscuts, etc.
- Powder X-ray diffraction using multiple approaches
- X-ray reflectivity including diffuse scattering
- Crystallographic texture analysis
- Residual stress analysis
- Small-angle X-ray scattering including grazing-incidence configurations
- Pair-Distribution Function methods
- X-ray fluorescence
- X-ray tomography, topography and imaging
- X-ray proteomics
The Atomicus team is proud to be a partner of Bruker and Rigaku, global corporations supplying analytical X-ray instrumentation, for large-scale and long-term software development projects. Besides direct experience in the physical interpretation of X-ray data, the developers within Atomicus have a deep knowledge of general processing of massive volumes of data, mathematical methods of optimization, 3D graphics, and many other techniques supplementing modern analytical tools.
The valuable experience accumulated by Atomicus team over decades in the business and science of X-ray analysis can be extended and applied effectively to other areas of analytical instrumentation requiring fundamental physical methodology and knowledge.